Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...

Atomic force microscopy (AFM) is utilized for surface measurements with atomic-level resolution — dimensions that are much beyond the highest resolution of optical microscopes. AFM is known to be a ...

Photothermal AFM-IR is a highly effective method for nanoscale chemical analysis, ideally suited to the stringent requirements of semiconductor research and production. By integrating the spatial ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Photothermal AFM-IR, or AFM-IR, is an analytical method used for chemical identification in a materials sample at the nanoscale. AFM-IR incorporates both the nanoscale spatial resolution of atomic ...

(Nanowerk News) Researchers at the Center for Integrated Nanostructure Physics, within the Institute for Basic Science (IBS), have shown that defects in monolayer molybdenum disulfide (MoS2) exhibit ...