STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...
The growing adoption of advanced processes below 3nm for AI GPUs and AI ASIC chips is driving a surge in test points and shrinking pitch sizes during the chip probing (CP) stage. Industry players ...
The MEMS-based Mx-FinePitch (Mx-FP) Probe Card addresses the ultra-fine-pitch testing needs of SOC and logic devices. Built for multi-DUT testing in high-volume production environments, the ...
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