EDN

Embedded SRAM test and repair moves on-chip

SAN MATEO, Calif. — With the rollout of its Star Memory System, an on-chip test and repair mechanism for embedded SRAM, memory compiler specialist Virage Logic Corp. is making good on its promise to ...
Design-Reuse

MoSys' 1T-SRAM embedded memory silicon-verified on 90-nanometer process

SUNNYVALE, Calif. (March 10, 2003) MoSys, Inc. (NASDAQ: MOSY) the industry’s leading provider of high density SoC embedded memory solutions today announced that MoSys’ 1T-SRAMÒ memory technology ...
Electronic Design

The Challenges of Memory Mix Test

The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...
EDN

Intel claims smallest SRAM cell with 90-nm process, preps technology for 2003 production

HANNOVER, Germany — In preparation of launching its next-generation 90-nm process technology, Intel Corp. today at the CeBit trade show here announced it has fabricated the industry's first fully ...
Outside

Six-Month Test: SRAM Red eTap Wireless Electronic Groupo

It took SRAM almost seven years longer than Shimano to release an electronic group set. But after nearly six months and over 1,000 miles of testing it, we can say—resoundingly—that it was worth the ...