Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...

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In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

In the single-beam FIB, such as our Hitachi FB-2000A FIB, some milling will occur during observation of the specimen. Surface features, such as thin films, can be milled away during this process. In ...