Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; IDDQ test methodologies; ...
Time-Consuming Setup and Reconfiguration: Establishing a scan path to reach an instrument deep within the hierarchical ...