STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

HSINCHU, June 14, 2023 /PRNewswire/ -- STAr Technologies, a leading test system and probe card supplier to semiconductor industry, today announced the opening of a new probe card demo and potential ...

Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...