Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...
Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical ...
SANTA CLARA, Calif., June 23, 2020 /PRNewswire-PRWeb/ -- Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes (AFM) is announcing Park NX-TSH, automated Tip Scan Head for large ...
Atomic force microscopy (AFM) is utilized for surface measurements with atomic-level resolution — dimensions that are much beyond the highest resolution of optical microscopes. AFM is known to be a ...
Photothermal AFM-IR, or AFM-IR, is an analytical method used for chemical identification in a materials sample at the nanoscale. AFM-IR incorporates both the nanoscale spatial resolution of atomic ...
The NanoRacer ® High-Speed AFM represents a significant advancement in the quantitative imaging field. It has never been simpler to visualize dynamic biological processes in real time with nanometer ...
Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...
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