Abstract: Aiming at the problem of insufficient detection accuracy for small target defects on steel surfaces, which often leads to missed detections and false alarms, this paper improves upon the ...

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...

Advanced packaging is a relatively new innovation in semiconductor fabrication, in which multiple devices (or dies) are bonded together before being encapsulated. It has become essential in enabling ...

A large Chinese cohort study identifies early pregnancy as a sensitive window during which sulfur dioxide exposure is associated with higher odds of limb abnormalities, sharpening the focus on air ...

Abstract: It is an important research area to optimize object detection methodology for improving the performance of steel surface defect detection. However, existing research is suffering from the ...

Even the smallest surface defect or slight roughness can significantly affect component performance. A micron-scale imperfection may appear insignificant at first; however, it can significantly alter ...