Researchers from the labs of Professors Vinayak Dravid and Omar Farha developed a high-resolution approach to map ...
By combining two fundamentally different microscopy techniques, researchers can now measure the optical properties of a ...
The ZEISS Xradia Versa family is the latest generation of 3D X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography. ZEISS 515 Versa advances industry and science with a ...
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