Abstract: A novel frequency-scanning phase-sensitive optical time domain reflectometry (Ï•-OTDR) based on symmetrical triangular linear frequency modulation (LFM) is proposed and demonstrated. By ...
Abstract: Atomic Force Microscope (AFM) has remained one of the most prominent morphology tools for examining the microscopic world. However, the 3D-AFM has several disadvantages. First, the physical ...
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